Reliability-aware SOC voltage islands partition and floorplan

被引:0
|
作者
Yang, Tshengqi [1 ]
Wolf, Wayne [1 ]
Vijaykrishnan, N. [2 ]
Xie, Yuan [2 ]
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
[2] Penn State Univ, Microsyst Design Lab, University Pk, PA 16802 USA
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Based on the proposed reliability characterization model, reliability-bounded low-power design as a methodology to balance reliability enhancement and power reduction in chip design, for the first time, is illustrated. Voltage island partitioning and floorplanning for System-On-a-Chip (SOC) design is used as a case study for this reliability aware methodology. The proposed methodology partitions all SOC components into different voltage islands with power reduction and guaranteed system reliability. Experiments show that for a typical SOC the algorithm execution time is within several minutes while achieving 12% to 23% power reduction. Extended SOC algorithm partitions and floorplanns the voltage islands within 2.5 to 29.7 minutes and achieved 9.74% to 18.50% power reduction.
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页码:343 / +
页数:2
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