Influence of trapping on silicon microstrip detector design and performance

被引：0
|
作者：
Kramberger, G [1 ]
Cindro, V [1 ]
Mandic, I [1 ]
Mikuz, M [1 ]
机构：
[1] Jozef Stefan Inst, SI-1000 Ljubljana, Slovenia
来源：
2001 IEEE NUCLEAR SCIENCE SYMPOSIUM, CONFERENCE RECORDS, VOLS 1-4 | 2002年
关键词：
simulation; silicon strip detectors; irradiation; charge collection efficiency; charge trapping;
D O I：
10.1109/NSSMIC.2001.1009703
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
New systematic measurements of effective carrier trapping times were used as an input to simulation of irradiated silicon strip detector operation. Charge collection efficiency (CCE) dependence on bias voltage, magnetic field, irradiation particle type, fluence and detector design was investigated. It was observed, that irradiated detectors processed on standard n-silicon material with n(+) strips performed better than those with p(+) strips. At Phi(eq) = 2 X 10(14) cm(-2) the difference is around 10% at voltages well above V-FD and even larger for lower voltages. A few percent difference in CCE for different track paths across the strip is predicted. Effective Lorentz angle was found to be independent on irradiation level. A non-negligible amount of charge appears also on neighboring strips as a consequence of charge trapping. The influence of detector thickness and strip width on induced charge was also studied.
引用
收藏
页码：909 / 913
页数：5
相关论文
共 50 条
  • [41] PERFORMANCE ON TEST BEAM OF THE L3 DOUBLE-SIDED SILICON MICROSTRIP DETECTOR
    ADAM, A
    ADRIANI, O
    AHLEN, S
    AMBROSI, G
    BABUCCI, E
    BASCHIROTTO, A
    BATTISTON, R
    BY, A
    BENCZE, GL
    BERTUCCI, B
    BIASINI, M
    BILEI, GM
    BOBBINK, GJ
    BOSETTI, M
    BROOKS, ML
    BUSENITZ, J
    BURGER, WJ
    CAMPS, C
    CARIA, M
    CASTELLINI, G
    CHECCUCCI, B
    CHEN, A
    COAN, TE
    COMMICHAU, V
    DIBITONTO, D
    DUINKER, P
    EASO, S
    EXTERMANN, P
    FIANDRINI, E
    GOUGAS, A
    HANGARTER, K
    HAUVILLER, C
    HERVE, A
    HU, G
    JOSA, I
    KAPUSTINSKI, JS
    KIM, D
    KINNISON, WW
    KRASTEV, VR
    LANDI, G
    LEBEAU, M
    LECOMTE, P
    LEE, DM
    LEISTE, R
    LIN, WT
    LOHMANN, W
    MARIN, A
    MASSETTI, R
    MILLS, GB
    NOWAK, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 348 (2-3): : 436 - 439
  • [42] Apical microstrip detector (design and characteristics of elements)
    Grebenev, V.N.
    Dzhelyadin, R.I.
    Karyukhin, A.N.
    Konoplyannikov, A.K.
    Kopikov, S.V.
    Loginov, A.I.
    Maloletnev, A.A.
    Mikaelyan, A.L.
    Pichugin, A.P.
    Poroshin, N.O.
    Shishkov, A.V.
    Pribory i Tekhnika Eksperimenta, 1994, (02): : 32 - 37
  • [43] A study of the spectroscopic performance of a CdTe microstrip detector
    Dusi, W
    Auricchio, N
    Brigliadori, L
    Cola, A
    Donati, A
    Landini, G
    Mengoni, D
    Perillo, E
    Siffert, P
    Ventura, G
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (04) : 1026 - 1030
  • [44] Two-dimensional breakdown voltage analysis and optimal design of a silicon microstrip detector passivated by a dielectric
    Srivastava, AK
    Bhardwaj, A
    Ranjan, K
    Namrata
    Chatterji, S
    Shivpuri, RK
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2002, 17 (05) : 427 - 434
  • [45] A MODEL FOR THE PERFORMANCE OF SILICON MICROSTRIP DETECTORS
    SAILOR, WC
    ZIOCK, HJ
    KINNISON, WW
    HOLZSCHEITER, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 303 (02): : 285 - 297
  • [46] Detector performance of the ALICE silicon pixel detector
    Cavicchioli, Costanza
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2011, 628 (01): : 77 - 80
  • [47] Performance of irradiated silicon microstrip detectors
    Catacchini, E
    Civinini, C
    D'Alessandro, R
    Focardi, E
    Lenzi, M
    Meschini, M
    Parrini, G
    Pieri, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 426 (01): : 34 - 37
  • [48] The design, construction, operation and performance of the Belle II silicon vertex detector
    Adamczyk, K.
    Aggarwal, L.
    Aihara, H.
    Aziz, T.
    Babu, V
    Bacher, S.
    Bahinipati, S.
    Bari, M.
    Baroncelli, Ti
    Baroncelli, To
    Bassi, G.
    Batignani, G.
    Baudot, J.
    Bauer, A.
    Behera, P. K.
    Bergauer, T.
    Bertacchi, V
    Bettarini, S.
    Bilka, T.
    Bosi, F.
    Bosisio, L.
    Bozek, A.
    Buchsteiner, F.
    Bulla, L.
    Casarosa, G.
    Cautero, G.
    Ceccanti, M.
    Chen, Y. Q.
    Chendvankar, S. R.
    Corona, L.
    Cristaudo, P.
    Czank, T.
    Das, S. B.
    Dash, N.
    de Marino, G.
    De Nuccio, M.
    De Pietro, G.
    Divekar, S. T.
    Dolejschi, P.
    Dolezal, Z.
    Dujany, G.
    Dutta, D.
    Finck, C.
    Fischer, K. D.
    Forti, F.
    Friedl, M.
    Fruhwirth, R.
    Gabrielli, A.
    Ganiev, E.
    Gfall, I
    JOURNAL OF INSTRUMENTATION, 2022, 17 (11)
  • [49] Influence of the Silicon Deposition on the Industrial Silicon Trapping Catalyst
    Chen, Xiaozhen
    Liu, Li
    Yang, Chengmin
    Zheng, Bumei
    Yin, Xiaoying
    Sun, Jin
    Yao, Yunhai
    Duan, Weiyu
    RUSSIAN JOURNAL OF APPLIED CHEMISTRY, 2024, 97 (03) : 313 - 321
  • [50] Test system for an optical readout chain of a silicon microstrip detector
    INFN, Milano, Italy
    Nucl Instrum Methods Phys Res Sect A, 3 (427-431):
12345