Traceable S-parameter measurements up to 90 GHz in 1.35 mm coaxial

被引:3
|
作者
Stokes, Daniel [1 ]
Gellersen, Frauke [2 ]
Allal, Djamel [3 ]
Skinner, James [1 ]
Phung, Gia Ngoc [2 ]
Kuhlmann, Karsten [2 ]
机构
[1] Natl Phys Lab NPL, Teddington TW11, England
[2] Phys Tech Bundesanstalt PTB, D-38116 Braunschweig, Germany
[3] Bur Natl Metrol LNE, F-75014 Paris, France
关键词
S-parameters; mm-wave; coaxial; measurement; traceability; intercomparison;
D O I
10.1088/1361-6501/acc04c
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
As part of a joint program three National Measurement Institutes around Europe-the National Physical Laboratory in the UK, the Physikalisch-Technische Bundesanstalt in Germany and the Laboratoire National de metrologie et d'essais in France-have each established new capabilities for the traceable measurement of S-parameters up to 90 GHz in the new 1.35 mm (E band) coaxial connector. Each institution has established their own measurement systems to access the full frequency band for the connector, utilising a variety of commercially available equipment and measurement setups. Each have also developed their own calibration techniques and verification methods using different vector network analyser calibration routines. These include optimised multi-line Through Reflect Line, multiple Offset Shorts Through and Short Open Load Reciprocal (SOLR) schemes. Uncertainties for each of these setups and calibration schemes were determined utilising theoretical models of the systems and calibration standards, or through verification methods, with different effects being derived from the dimensional characteristics for each of the different standards or verification artifacts. The different dimensional systems used to make these measurements were also developed and established previously as part of the same program. The last part of this exercise was a three-way intercomparison between the laboratories. The comparison involved the measurement of a set of four traveling standards, including both 1-port and 2-port as well as plug (male) and jack (female) devices, each with different reflection and transmission characteristics to better test and demonstrate the equivalence of the capabilities.
引用
收藏
页数:8
相关论文
共 50 条
  • [31] TRACEABILITY FOR ON-WAFER S-PARAMETER MEASUREMENTS
    BANNISTER, DJ
    PERKINS, M
    [J]. IEE PROCEEDINGS-A-SCIENCE MEASUREMENT AND TECHNOLOGY, 1992, 139 (05): : 232 - 234
  • [32] Accurate broadband parameter extraction methodology for S-parameter measurements
    Balachandran, J
    Brebels, S
    Carchon, G
    De Raedt, W
    Nauwelaers, B
    Beyne, E
    [J]. SIGNAL PROPAGATION ON INTERCONNECTS, PROCEEDINGS, 2005, : 57 - 60
  • [33] Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz
    Shang, Xiaobang
    Ridler, Nick
    Arz, Uwe
    Gia Ngoc Phung
    Roch-Jeune, Isabelle
    Ducournau, Guillaume
    Haddadi, Kamel
    Flisgen, Thomas
    Doerner, Ralf
    Allal, Djamel
    Jayasankar, Divya
    Stake, Jan
    Schmidt, Robin
    Fisher, Gavin
    Mubarak, Faisal
    [J]. 2023 53RD EUROPEAN MICROWAVE CONFERENCE, EUMC, 2023, : 624 - 627
  • [34] Uncertainty Evaluation of Balanced S-Parameter Measurements
    Ziade, F.
    Hudlicka, M.
    Salter, M.
    Pavlicek, T.
    Allal, D.
    [J]. 2016 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2016), 2016,
  • [35] Pulsed S-parameter measurements: on resolution, and uncertainty
    Martens, J.
    [J]. 2013 IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONICS SYSTEMS (IEEE COMCAS 2013), 2013,
  • [36] Make accurate pulsed S-Parameter measurements
    Betts, L
    [J]. MICROWAVES & RF, 2003, 42 (11) : 72 - +
  • [37] S-parameter characterization of mm-wave Impatt oscillators
    Hasch, J
    Kasper, E
    [J]. 2006 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS, DIGEST OF PAPERS, 2006, : 213 - +
  • [38] A simplified calibration procedure for on-wafer power levelled S-parameter measurements at mm-wave
    Galbano, S.
    Galatro, L.
    Spirito, M.
    [J]. 2015 85TH ARFTG MICROWAVE MEASUREMENT CONFERENCE, 2015,
  • [39] Reduced temperature S-parameter measurements of 400+GHz sub-micron InP DHBTs
    Li, James Chingwei
    Hussain, Tahir
    Hitko, Donald A.
    Royter, Yakov
    Fields, Charles H.
    Milosavljevic, Ivan
    Thomas, Stephen, III
    Rajavel, Rajesh D.
    Asbeck, Peter M.
    Sokolich, Marko
    [J]. SOLID-STATE ELECTRONICS, 2007, 51 (06) : 870 - 881
  • [40] Restoration of passivity in S-parameter data of microwave measurements
    Saraswat, D
    Achar, R
    Nakhla, M
    [J]. 2005 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-4, 2005, : 1131 - 1134