Prospects of mist CVD for fabrication of β-Ga2O3 MESFETs on β-Ga2O3 (010) substrates

被引:4
|
作者
Takane, Hitoshi [1 ]
Ando, Yuji [2 ,3 ]
Takahashi, Hidemasa [3 ]
Makisako, Ryutaro [3 ]
Ikeda, Hikaru [4 ]
Ueda, Tetsuzo [5 ]
Suda, Jun [2 ,3 ]
Tanaka, Katsuhisa [1 ]
Fujita, Shizuo [4 ]
Sugaya, Hidetaka [6 ]
机构
[1] Kyoto Univ, Dept Mat Chem, Kyoto 6158510, Japan
[2] Nagoya Univ, Inst Mat & Syst Sustainabil, Nagoya 4648601, Japan
[3] Nagoya Univ, Dept Elect, Nagoya 4648601, Japan
[4] Kyoto Univ, Acad Collaborat Innovat, Off Soc, Kyoto 6068501, Japan
[5] Panason Ind Co Ltd, Kadoma 5718506, Japan
[6] Panasonic Corp, Living Appliances & Solut Co, Tokyo 1058301, Japan
关键词
mist CVD; MESFET; beta-Ga2O3; homoepitaxial growth; THIN-FILMS; HOMOEPITAXIAL GROWTH; SINGLE-CRYSTALS; KV BREAKDOWN; MOBILITY; LAYERS;
D O I
10.35848/1882-0786/acefa5
中图分类号
O59 [应用物理学];
学科分类号
摘要
Mist CVD was applied to grow the ss-Ga2O3 channel layer of a MESFET on a semi- insulating ss-Ga(2)o(3) (010) substrate. The mobility and carrier concentration of the channel layer were 80 cm(2) V-1 s(-1) and 6.2 x 10(17) cm(-3), respectively. The device exhibited a pinch-off characteristic with a threshold gate voltage of -9 V, and the maximum drain current was 240 mA mm(-1). The maximum transconductance was 46 mS mm(-1) and the onresistance was 30 Omega mm. This device performance suggests that mist CVD is a potential growth technology capable of providing low-cost devices in the future. (c) 2023 The Author(s). Published on behalf of The Japan Society of Applied Physics by IOP Publishing Ltd
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页数:4
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