Switching (Turn-on) Dynamics of Low-Voltage InP Homothyristors

被引:0
|
作者
Slipchenko, S. O. [1 ]
Soboleva, O. S. [1 ]
Podoskin, A. A. [1 ]
Kirichenko, Y. K. [1 ]
Bagaev, T. A. [1 ]
Yarotskaya, I. V. [1 ]
Pikhtin, N. A. [1 ]
机构
[1] Ioffe Inst, St Petersburg 194021, Russia
基金
俄罗斯科学基金会;
关键词
thyristor; impact ionization; drift-diffusion model; POWER;
D O I
10.1134/S1063782623050159
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A series of heterostructure designs of low-voltage InP homothyristors have been investigated using numerical simulation methods. The design with a space charge layer formed in the p-base region of the n-p-n transistor part was considered as the base one. The dynamic characteristics and processes that determine the rate of transition to the on state are investigated. It is shown that as the p-base thickness increases from 1 to 2.6 mu m, the maximum on-state currents increase from 70 to 90 A, while the minimum turn-on transition time is 11 ns at a maximum blocking voltage of 55 V. It is shown that the operation efficiency in the on state is determined by the residual voltage. Residual voltage decreases with a decrease in the thickness of the p-base.
引用
收藏
页码:166 / 171
页数:6
相关论文
共 50 条
  • [1] Switching (Turn-on) Dynamics of Low-Voltage InP Homothyristors
    S. O. Slipchenko
    O. S. Soboleva
    A. A. Podoskin
    Y. K. Kirichenko
    T. A. Bagaev
    I. V. Yarotskaya
    N. A. Pikhtin
    [J]. Semiconductors, 2023, 57 : 166 - 171
  • [2] Spatial dynamics of high current turn-on in low-voltage AlGaAs/GaAs phototransistors
    Slipchenko, S. O.
    Podoskin, A. A.
    Soboleva, O. S.
    Pikhtin, N. A.
    Bagaev, T. A.
    Ladugin, M. A.
    Marmalyuk, A. A.
    Simakov, V. A.
    Tarasov, I. S.
    [J]. JOURNAL OF APPLIED PHYSICS, 2016, 119 (12)
  • [3] Low-Voltage Turn-On Characteristics of RSD for Muzzle Arc Extinguishing of Electromagnetic Guns
    Qing, Zhengheng
    Liang, Lin
    Han, Lubin
    Huang, Xinyuan
    Yang, Zewei
    [J]. IEEE TRANSACTIONS ON PLASMA SCIENCE, 2022, : 3701 - 3706
  • [4] Low-Voltage Steep Turn-On pMOSFET Using Ferroelectric High-κ Gate Dielectric
    Cheng, Chun Hu
    Chin, Albert
    [J]. IEEE ELECTRON DEVICE LETTERS, 2014, 35 (02) : 274 - 276
  • [5] Abnormal ESD Failure Mode with Low-Voltage Turn-on Phenomenon of LDMOS Output Driver
    Park, Jaeyoung
    Orshansky, Michael
    [J]. 2012 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2012,
  • [6] SWITCHING LOW-VOLTAGE TRANSDUCER
    BOLTYANSKII, AA
    VASIN, NN
    SEKISOV, YN
    SKOBELEV, OP
    [J]. MEASUREMENT TECHNIQUES, 1974, 17 (04) : 533 - 535
  • [7] Switching Overvoltage in Low-voltage Network
    Balogh, Jozef
    Dolnik, Bystrik
    Kurimsky, Juraj
    Molnar, Roman
    [J]. PROCEEDINGS OF THE 7TH INTERNATIONAL SCIENTIFIC CONFERENCE ELECTRIC POWER ENGINEERING 2006, 2006, : 271 - 274
  • [8] Deep n-well dtscr with fast turn-on speed for low-voltage esd protection applications
    Ma, Boyang
    Chen, Shupeng
    Chen, Ruibo
    Liu, Hongxia
    Wang, Shulong
    Han, Zeen
    [J]. MICROELECTRONICS RELIABILITY, 2024, 160
  • [9] Interleaved SEPIC Converter with Low Turn-On Switching Loss
    Lin, Bor-Ren
    Chen, Po-Li
    Chen, Jyun-Ji
    [J]. INTERNATIONAL REVIEW OF ELECTRICAL ENGINEERING-IREE, 2010, 5 (04): : 1370 - 1380
  • [10] LOW-TEMPERATURE LOW-VOLTAGE OPERATION OF HEMTS ON INP
    SYLVESTRE, A
    CROZAT, P
    ADDE, R
    DELUSTRAC, A
    JIN, Y
    [J]. JOURNAL DE PHYSIQUE IV, 1994, 4 (C6): : 153 - 158