A 14b 500 MS/s Single-Channel Pipelined-SAR ADC With Reference Ripple Mitigation Techniques and Adaptively Biased Floating Inverter Amplifier

被引:5
|
作者
Jiang, Wenning [1 ,2 ]
Zhu, Yan [3 ]
Chen, Chixiao [1 ,2 ]
Xu, Hao [4 ]
Liu, Qi [2 ]
Liu, Ming [1 ,2 ]
Martins, Rui P. [3 ,5 ]
Chan, Chi-Hang [3 ]
机构
[1] Fudan Univ, Frontier Inst Chips & Syst, Shanghai 200433, Peoples R China
[2] Fudan Univ, State Key Lab Integrated Chips & Syst, Shanghai 200433, Peoples R China
[3] Univ Macau, Inst Microelect, Dept ECE FST, State Key Lab Analog & Mixed Signal VLSI, Macau, Peoples R China
[4] Fudan Univ, State Key Lab Integrated Chips & Syst, Shanghai 201203, Peoples R China
[5] Univ Lisbon, Inst Super Tecn, P-1049001 Lisbon, Portugal
基金
中国国家自然科学基金;
关键词
Adaptive bias; analog-to-digital converter (ADC); floating inverter amplifier (FIA); pipelined-successive-approximation-register (SAR) ADC; reference ripple cancellation (RRC); reference ripple neutralization (RRN);
D O I
10.1109/JSSC.2023.3290119
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work presents a 14-bit 500 MS/s single-channel pipelined-successive-approximation-register (SAR) analog-todigital converter (ADC) with an adaptively biased floating inverter amplifier (AB-FIA) as the residue amplifier (RA) and a hybrid reference ripple mitigation (H-RRM) technique to relax the power and area burden on the reference stabilization. Leveraging the adaptively biased architecture in the last stage FIA, the speed and open-loop gain of the proposed two-stage FIA are enhanced compared with the conventional cascode counterpart. Besides, the impact of the reference error on the pipelined-SAR conversion accuracy is alleviated by hybridizing the improved reference ripple cancellation (RRC), reference ripple neutralization (RRN), and reference buffer (RBUF). The improved RRC removes the potential noise coupled from the floating capacitor to counter the decision error during the sub-SAR conversion in the first stage. Meanwhile, the RRN facilitates a rapid reference recovery. These acts constitute the H-RRM, which assists a high-speed and high-resolution pipelined-SAR process with a relaxed integrated reference RBUF with low-power and compact area. The prototype ADC was fabricated in a 28 nm CMOS process; it consumes 6.34 mW total power at 500 MS/s, including 2.4 mW dynamic power of RBUF. It occupies an active area of 0.018 mm(2), which the ADC core area of 0.0168 mm(2) and the area of RBUF with a 2.3 pF decoupling capacitor is 0.00105 mm(2). The measured signal to noise and distortion ratio (SNDR) and spurious free dynamic range (SFDR) are 64.2 dB and 80.55 dB with a Nyquist input, respectively, leading to a 170.2 dB Schreier figure-of-merit (FoM) (FoMS) and 9.6 fJ/conversion-step Walden FoM (FoMW).
引用
收藏
页码:2709 / 2721
页数:13
相关论文
共 35 条
  • [21] A 12b 330MS/s Pipelined-SAR ADC with PVT-Stabilized Dynamic Amplifier Achieving <1dB SNDR Variation
    Huang, Hai
    Sarkar, Sudipta
    Elies, Brian
    Chiu, Yun
    2017 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE (ISSCC), 2017, : 472 - 472
  • [22] A 2.08-mW 64.4-dB SNDR 400-MS/s Pipelined-SAR ADC Using Mismatch and PVT Variation Tolerant Dynamically Biased Ring Amplifier in 8 nm
    Lim, Yong
    Lee, Jaehoon
    Lee, Jongmi
    Lim, Kwangmin
    Oh, Seunghyun
    Lee, Jongwoo
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2024, : 4199 - 4210
  • [23] A Single-Channel, 600-MS/s, 12-b, Ringamp-Based Pipelined ADC in 28-nm CMOS
    Lagos, Jorge
    Hershberg, Benjamin
    Martens, Ewout
    Wambacq, Piet
    Craninckx, Jan
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2019, 54 (02) : 403 - 416
  • [24] A Calibration-Free 14-b 0.7-mW 100-MS/s Pipelined-SAR ADC Using a Weighted- Averaging Correlated Level Shifting Technique
    Wang, Jia-Ching
    Hung, Tsung-Chih
    Kuo, Tai-Haur
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2020, 55 (12) : 3271 - 3280
  • [25] A Non-Interleaved 12-b 330-MS/s Pipelined-SAR ADC With PVT-Stabilized Dynamic Amplifier Achieving Sub-1-dB SNDR Variation
    Huang, Hai
    Xu, Hongda
    Elies, Brian
    Chiu, Yun
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2017, 52 (12) : 3235 - 3247
  • [26] A Single-Channel 1.25-GS/s 11-bit Pipelined ADC with Robust Floating-Powered Ring Amplifier and First-Order Gain Error Calibration
    Lan, Jingchao
    Zhang, Yuxuan
    Ye, Fan
    Ren, Junyan
    2022 IEEE 65TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS 2022), 2022,
  • [27] A Single-Channel 12-b 2-GS/s PVT-Robust Pipelined ADC With Sturdy Ring Amplifier and Time-Domain Quantizer
    Cao, Yuefeng
    Zhang, Minglei
    Zhu, Yan
    Martins, Rui P.
    Chan, Chi-Hang
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2025, 60 (02) : 443 - 455
  • [28] A 10-b 750μW 200MS/s Fully Dynamic Single-Channel SAR ADC in 40nm CMOS
    Tang, Xiyuan
    Chen, Long
    Song, Jeonggoo
    Sun, Nan
    ESSCIRC CONFERENCE 2016, 2016, : 413 - 416
  • [29] A 0.7V 12b 160MS/s 12.8fJ/conv-step Pipelined-SAR ADC in 28nm CMOS with Digital Amplifier Technique
    Yoshioka, Kentaro
    Sugimoto, Tomohiko
    Waki, Naoya
    Kim, Sinnyoung
    Kurose, Daisuke
    Ishii, Hirotomo
    Furuta, Masanori
    Sai, Akihide
    Itakura, Tetsuro
    2017 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE (ISSCC), 2017, : 478 - 478
  • [30] A Temperature-Stabilized Single-Channel 1-GS/s 60-dB SNDR SAR-Assisted Pipelined ADC With Dynamic Gm-R-Based Amplifier
    Jiang, Wenning
    Zhu, Yan
    Zhang, Minglei
    Chan, Chi-Hang
    Martins, Rui Paulo
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2020, 55 (02) : 322 - 332