Cryogenic Characterization of 40nm CMOS for Quantum Control Applications

被引:0
|
作者
Mani, Aarthy [1 ]
Leong, Victor [2 ]
Anh Tuan Do [1 ]
机构
[1] ASTAR, IME, Singapore, Singapore
[2] ASTAR, IMRE, Singapore, Singapore
基金
新加坡国家研究基金会;
关键词
Cryogenic CMOS; quantum control & read-out;
D O I
10.1109/ISOCC59558.2023.10396083
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
CMOS circuits operating at cryogenic temperatures are gaining momentum as a promising approach for scaling up future quantum processors. However, standard SPICE models provided by the foundries do not accurately capture device behavior in cryogenic environments, thus hindering circuit design and optimization. Rigorous cryogenic characterization of CMOS devicesis required to capture their performance shift at very low temperatures. This work reports our 40nm CMOS transistor test chip and its preliminary characterization at 8 K. This serves as an important step towards developing efficient cyrogenic CMOS chip for quantum control applications.
引用
收藏
页码:3 / 4
页数:2
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