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- [22] Synergistic effects of total ionizing dose on single event upset sensitivity in static random access memory under proton irradiationChinese Physics B, 2014, (11) : 616 - 619肖尧论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology论文数: 引用数: h-index:机构:张凤祁论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology赵雯论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology王燕萍论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology张科营论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology丁李利论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology范雪论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Electronic Thin Films and Integrated Devices State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology罗尹虹论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology王园明论文数: 0 引用数: 0 h-index: 0机构: State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology
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- [24] Total Ionizing Dose (TID) Effects on Finger Transistors in a 65nm CMOS Process2016 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2016, : 5 - 8Jiang, Jize论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, SingaporeShu, Wei论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, SingaporeChong, Kwen-Siong论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, SingaporeLin, Tong论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, SingaporeLwin, Ne Kyaw Zwa论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, SingaporeChang, Joseph S.论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, SingaporeLiu, Jingyuan论文数: 0 引用数: 0 h-index: 0机构: Nanyang Technol Univ, Singapore, Singapore Nanyang Technol Univ, Singapore, Singapore
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- [26] Modeling of High Total Ionizing Dose (TID) Effects for Enclosed Layout Transistors in 65 nm Bulk CMOSCAS 2018 PROCEEDINGS: 2018 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 2018, : 133 - 136Nikolaou, Aristeidis论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, Greece Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, GreeceBucher, Matthias论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, Greece Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, Greece论文数: 引用数: h-index:机构:Papadopoulou, Alexia论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, Greece Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, GreeceChevas, Loukas论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, Greece Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, GreeceBorghello, Giulio论文数: 0 引用数: 0 h-index: 0机构: Univ Udine, DPIA, I-33100 Udine, Italy CERN, EP Dept, CH-1211 Geneva, Switzerland Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, GreeceKoch, Henri D.论文数: 0 引用数: 0 h-index: 0机构: Univ Mons, SEMi, B-7000 Mons, Belgium CERN, EP Dept, CH-1211 Geneva, Switzerland Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, GreeceFaccio, Federico论文数: 0 引用数: 0 h-index: 0机构: CERN, EP Dept, CH-1211 Geneva, Switzerland Tech Univ Crete, Sch Elect & Comp Engn, Khania 73100, Greece
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