Modelling of Power Semiconductor Devices Switching and Conduction Losses in a Power Electronic System

被引:0
|
作者
Hashim, N. S. [1 ]
Poobalan, B. [1 ,2 ]
Zakaria, N. F. [1 ,3 ]
Natarajan, Manikandan [4 ]
Shaari, Safizan [1 ]
机构
[1] Univ Malaysia Perlis, Fac Elect Engn Technol, Arau 02600, Perlis, Malaysia
[2] Univ Malaysia Perlis, Ctr Excellence CoE, MicroSyst Technol, Arau 02600, Perlis, Malaysia
[3] Univ Malaysia Perlis, Ctr Excellence CoE, Adv Commun Engn, Arau 02600, Perlis, Malaysia
[4] AIMST Univ, Fac Dent, Bedong 08100, Kedah, Malaysia
关键词
Power semiconductor devices; regression analysis; numerical simulation; switching and conduction losses; BOOST CONVERTER;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In power converters, power semiconductor devices, mainly Insulated-Gate Bipolar Transistor (IGBT), are generally used as they are less costly and capable of converting electrical energy into high frequency and voltage. It is critical to accurately determine the switching and conduction losses of power devices before they are assembled into an electronic system. The accurate values help to minimize power loss in a power converter system. With the aid of simulation, design problems are identified to help eliminate device destruction, and critical parameters are monitored. In addition, costly equipment for measuring purposes and testing prototypes is not required at the initial design stage. This research uses simulation work in a power converter system to predict IGBT and diode losses with varied frequencies and voltages. The predictive modelling is produced using regression analysis. The models have been validated by R square (R2) and Mean Absolute Percentage Error (MAPE) techniques. This work is aimed at providing a supervised learning technique mainly used in a machine learning environment, in line with the technological development in the semiconductor industry. With the simulation performed in this work, the efficiency of a boost converter system is enhanced as it shows the models have a good fit with an R-2 value of almost 1, and MAPE values are noticed to be less than 5%.
引用
收藏
页码:177 / 185
页数:9
相关论文
共 50 条
  • [21] Quantum, power, and compound semiconductor devices - Breaking the limits: Si, SIC and GaN power switching devices
    Ferdinand Braun Institut
    不详
    Tech. Dig. Int. Electron Meet. IEDM, 2006,
  • [22] Switching loss analysis and modeling of power semiconductor devices base on an automatic measurement system
    Shen, Yanqun
    Xiong, Yan
    Jiang, Jian
    Deng, Yan
    He, Xiangning
    Zeng, Zhaohui
    2006 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-7, 2006, : 853 - +
  • [23] Proper Selection of Power Semiconductor Devices for Switching Applications.
    Rischmueller, Klaus
    Elektronik Munchen, 1980, 29 (22): : 79 - 84
  • [24] Investigation and Comparison on Switching Performance of Semiconductor Pulsed Power Devices
    Chen, Changdong
    Liang, Lin
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2015, 43 (09) : 3304 - 3309
  • [25] Thermal measurement for verification of power loss in semiconductor switching devices
    Nowak, Mieczyslaw
    Grzejszczak, Piotr
    Zdanowski, Mariusz
    Barlik, Roman
    PRZEGLAD ELEKTROTECHNICZNY, 2012, 88 (4B): : 163 - 168
  • [26] Precision Calorimetry for the Accurate Measurement of Losses in Power Electronic Devices
    Weier, Sven
    Shafi, Mohsin A.
    McMahon, Richard
    IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2010, 46 (01) : 278 - 284
  • [27] Future Prospects of Widebandgap (WBG) Semiconductor Power Switching Devices
    Shenai, Krishna
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (02) : 248 - 257
  • [28] On the Power-Handling Capability of Wide Bandgap (WBG) Semiconductor Power Switching Devices
    Shenai, Krishna
    GALLIUM NITRIDE AND SILICON CARBIDE POWER TECHNOLOGIES 4, 2014, 64 (07): : 193 - 201
  • [29] Precision Calorimetry for the Accurate Measurement of Losses in Power Electronic Devices
    Weier, S. D. J.
    Shafi, M. A.
    McMahon, R. A.
    2008 IEEE INDUSTRY APPLICATIONS SOCIETY ANNUAL MEETING, VOLS 1-5, 2008, : 1472 - 1478
  • [30] Measurement and modelling of power electronic devices at cryogenic temperatures
    Forsyth, A. J.
    Yang, S. Y.
    Mawby, P. A.
    Igic, P.
    IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 2006, 153 (05): : 407 - 415