Ultraviolet (UV) photodetectors (PDs) have attracted significant attention for civil and military applications. Zinc oxide (ZnO) and nickel oxide (NiO) have been widely applied in UV-PDs due to their wide bandgap (3.2-3.8 eV), transparency, excellent optical and electrical properties, and good chemical stability. However, UV signals are generally weak; hence, UV-PDs with high optical gain are essential. In this work, high-performance solar-blind p-NiO/n-ZnO/p-Si heterojunction bipolar phototransistors (HBPTs) were fabricated. The fabricated HBPTs exhibited a high responsivity of 9.4 x 10(3) A/W at a wavelength of 280 nm with V-CE = -7 V, a high optical gain of 3.96 x 10(4), and a large detectivity of 3 x 10(13) Jones. In addition, the UV/visible rejection ratio was as high as 880. These behaviors indicate that the prepared HBPTs are good solar-blind PDs and suitable for the detection of weak UV signals. However, for VCE value below -7 V, (|V-CE| > 7 V), the optical gain decreased due to the punchthrough effect. Furthermore, band diagrams showed that the photogenerated electrons were blocked by the potential barrier at the NiO/ZnO interface (base-emitter junction) due to a large conduction-band discontinuity (Delta E-C) of 2.7 eV, which resulted in a large optical gain in the prepared HBPTs.