共 50 条
- [41] Welcome to the IEEE International: 3D system integration conference (3DIC) IEEE 3D System Integration Conference 2010, 3DIC 2010, 2010,
- [43] TSV RF de-embedding method and modeling for 3DIC 2012 23RD ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2012, : 394 - 397
- [44] Heterogeneous Integration Enabled by the State-of-the-Art 3DIC and CMOS Technologies: Design, Cost, and Modeling 2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2021,
- [45] TSV/3DIC Profile Metrology Based on Infrared Microscope Image CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2011 (CSTIC 2011), 2011, 34 (01): : 937 - 942
- [46] Study of TSV Thinning Wafer Strength Enhancement for 3DIC Package 2014 IEEE 64TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2014, : 868 - 872
- [48] Characterization of Micro-Bumps for 3DIC Wafer Acceptance Tests 2019 IEEE 32ND INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS), 2019, : 180 - 183
- [49] FEA Simulations for Thermal Distributions of Large Scale 3DIC Packages IEEE ACCESS, 2024, 12 : 76837 - 76843