FEA Simulations for Thermal Distributions of Large Scale 3DIC Packages

被引:1
|
作者
Chen, Suxia [1 ]
Wu, Qiang [2 ]
Xun, Wayne [3 ]
Zhang, Jiachen [4 ]
Xun, Jianping [3 ]
机构
[1] Henan Vocat Coll Light Ind, Zhengzhou 450006, Henan, Peoples R China
[2] SiVic Microelect, Jiaxing 314000, Zhejiang, Peoples R China
[3] DGClaim Inc, Portland, OR 97229 USA
[4] Portland State Univ, Dept Comp Sci, Portland, OR 97201 USA
来源
IEEE ACCESS | 2024年 / 12卷
关键词
Heating systems; Computational modeling; Integrated circuit modeling; Temperature distribution; Random access memory; Through-silicon vias; Thermal analysis; Artificial intelligence; High performance computing; Power distribution; Thermal distribution; 3DIC; BBCube; FEA simulation; DRAM;
D O I
10.1109/ACCESS.2024.3397616
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
As the market increases for Artificial Intelligence and High-Performance Computing applications, the geometry of 3-Dimensional Integrated Circuit packages becomes more complicated; therefore, predicting the thermal distributions of the structures becomes not only more important but also more challenging. The physics governing the thermal distribution is a 3-dimensional partial differential equation. In order to predict the thermal distributions, various approaches such as the layer modeling method have been invented. While practical, these approaches solve a simplified version of the differential equation placing an inherent limitation on their capabilities which may be improved upon. In this research we solve the actual differential equation using Finite Element Analysis. Finite Element Analysis is known to produce accurate solutions, albeit being computationally intensive, and may take days to run even with a powerful computer, making it impractical for some applications. In this paper, we present case studies of computing the thermal distributions of large scale 3-dimensional integrated circuit models using XSim. We find that XSim's solving capabilities are capable of computing accurate thermal distributions of large-scale models in minutes instead of days. This suggests a new way to compute the thermal distributions rapidly and accurately for large 3-Dimensional Integrated Circuit packages, which may bring potential benefits in research, design and development of 3-Dimensional Integrated Circuit packages.
引用
收藏
页码:76837 / 76843
页数:7
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