Contacts and Dielectrics for Two-Dimensional Semiconductors

被引：0
|
作者：
Vandenberghe, William [1 ]
机构：
[1] Univ Texas Dallas, Richardson, TX 75080 USA
来源：
2023 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI-TSA/VLSI-DAT | 2023年
关键词：
D O I：
10.1109/VLSI-TSA/VLSI-DAT57221.2023.10134403
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：1
相关论文
共 50 条
  • [21] Measure of Diracness in two-dimensional semiconductors
    Goerbig, M. O.
    Montambaux, G.
    Piechon, F.
    [J]. EPL, 2014, 105 (05)
  • [22] Hyperspectral microscopy of two-dimensional semiconductors
    Trovatello C.
    Genco A.
    Cruciano C.
    Ardini B.
    Li Q.
    Zhu X.
    Valentini G.
    Cerullo G.
    Manzoni C.
    [J]. Optical Materials: X, 2022, 14
  • [23] Valley excitons in two-dimensional semiconductors
    Yu, Hongyi
    Cui, Xiaodong
    Xu, Xiaodong
    Yao, Wang
    [J]. NATIONAL SCIENCE REVIEW, 2015, 2 (01) : 57 - 70
  • [24] Contact engineering for two-dimensional semiconductors
    Peng Zhang
    Yiwei Zhang
    Yi Wei
    Huaning Jiang
    Xingguo Wang
    Yongji Gong
    [J]. Journal of Semiconductors, 2020, 41 (07) : 12 - 27
  • [25] Contact engineering for two-dimensional semiconductors
    Zhang, Peng
    Zhang, Yiwei
    Wei, Yi
    Jiang, Huaning
    Wang, Xingguo
    Gong, Yongji
    [J]. JOURNAL OF SEMICONDUCTORS, 2020, 41 (07)
  • [26] Traditional Semiconductors in the Two-Dimensional Limit
    Lucking, Michael C.
    Xie, Weiyu
    Choe, Duk-Hyun
    West, Damien
    Lu, Toh-Ming
    Zhang, S. B.
    [J]. PHYSICAL REVIEW LETTERS, 2018, 120 (08)
  • [27] Mobility anisotropy of two-dimensional semiconductors
    Lang, Haifeng
    Zhang, Shuqing
    Liu, Zhirong
    [J]. PHYSICAL REVIEW B, 2016, 94 (23)
  • [28] EFFECTIVE ACTION OF TWO-DIMENSIONAL DIELECTRICS AND SPINONS
    LARKIN, AI
    [J]. PHYSICA SCRIPTA, 1989, T27 : 107 - 108
  • [29] Superconducting contacts to a two-dimensional electron gas
    Williams, DA
    Moore, TD
    Newcomb, SB
    [J]. MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, 1999, (164): : 557 - 560
  • [30] Reliable contacts to two-dimensional conduction layers
    Souw, V
    Li, S
    McElfresh, M
    Duan, Z
    McInturff, D
    Yulius, A
    Chen, EH
    Woodall, JM
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (22) : 3307 - 3309
12345