We propose and investigate a metal oxide heterostructure(MOH) based resistive switching(RS) device.The driving mechanism of resistive switching(RS) in an MOH is more directly related to oxygen ion/vacancy migration around their interface.The performance of an MOH-based RS device depends on the oxygen mobility,oxygen vacancy concentration as well as its relation to the resistivity.An enhanced ratio of high resistance state to low resistance state can be achieved if the two involved metal oxides are mutually complemental metal oxides in which one of them has larger resistivity with increasing concentration of vacancy while the other one is the reverse.
机构:
Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, 3 BeiTuCheng West Rd, Beijing 100029, Peoples R ChinaPohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Ctr Single Atom Based Semicond Device, Pohang 790784, South Korea
Liu, Qi
Hwang, Hyunsang
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机构:
Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Ctr Single Atom Based Semicond Device, Pohang 790784, South KoreaPohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Ctr Single Atom Based Semicond Device, Pohang 790784, South Korea