Multifractallity at the mobility edge in amorphous semiconductors

被引：0

作者：

Zou, Xuecheng ^{[1
]}

Xu, Zhongyang ^{[1
]}

Zhang, Shaoqiang ^{[1
]}

Wang, Changan ^{[1
]}

Li, Xingjiao ^{[1
]}

机构：

[1] Huazhong Univ of Science and, Technology, Wuhan, China

来源：

Yadian Yu Shengguang/Piezoelectrics and Acoustooptics | 1996年 / 18卷 / 02期

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：100 / 105

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[21] TEMPERATURE DEPENDENCE OF ABSORPTION-EDGE IN SOME AMORPHOUS SEMICONDUCTORS
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