Multifractallity at the mobility edge in amorphous semiconductors

被引：0
|
作者：
Zou, Xuecheng [1 ]
Xu, Zhongyang [1 ]
Zhang, Shaoqiang [1 ]
Wang, Changan [1 ]
Li, Xingjiao [1 ]
机构：
[1] Huazhong Univ of Science and, Technology, Wuhan, China
来源：
Yadian Yu Shengguang/Piezoelectrics and Acoustooptics | 1996年 / 18卷 / 02期
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摘要：
9
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页码：100 / 105
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