On test set generation for efficient path delay fault diagnosis

被引：0
|
作者：
Tekumalla, Ramesh C. [1 ]
机构：
[1] Intel Corp, Hillsboro, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 2000年
关键词：
D O I：
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学科分类号：
摘要：
Integrated circuit testing
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页码：343 / 348
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