Experimental measurement of the intensity profiles of a low-energy electron beam extracted from a scanning tunneling microscope tip by field emission

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作者：
Kawamoto, Ippei [1 ]
Nan, Lai [1 ]
Yoshinobu, Tatsuo [1 ]
Iwasaki, Hiroshi [1 ]
机构：
[1] Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-00-17, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 10期
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页码：6172 / 6173
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