Characterization of an electron emitting tip by field emission microscope and scanning probe microscope

被引：0
|
作者：
Watanabe, Norimichi [1 ]
Tanaka, Miyuki [1 ]
Shimizu, Tetsuo [1 ]
机构：
[1] Nanosystem Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba-shi, Ibaraki,305-8562, Japan
来源：
Journal of the Vacuum Society of Japan | 2015年 / 58卷 / 04期
关键词：
D O I：
10.3131/jvsj2.58.131
中图分类号：
学科分类号：
摘要：
18
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页码：131 / 133
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