Characterization of an electron emitting tip by field emission microscope and scanning probe microscope

被引：0

作者：

Watanabe, Norimichi ^{[1
]}

Tanaka, Miyuki ^{[1
]}

Shimizu, Tetsuo ^{[1
]}

机构：

[1] Nanosystem Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba-shi, Ibaraki,305-8562, Japan

来源：

Journal of the Vacuum Society of Japan | 2015年 / 58卷 / 04期

关键词：

D O I：

10.3131/jvsj2.58.131

中图分类号：

学科分类号：

摘要：

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页码：131 / 133

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