Experimental measurement of the intensity profiles of a low-energy electron beam extracted from a scanning tunneling microscope tip by field emission

被引：0

作者：

Kawamoto, Ippei ^{[1
]}

Nan, Lai ^{[1
]}

Yoshinobu, Tatsuo ^{[1
]}

Iwasaki, Hiroshi ^{[1
]}

机构：

[1] Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-00-17, Japan

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 10期

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：6172 / 6173

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