Microanalysis and Depth Profile Analysis by Auger Electron Spectroscopy.

被引：0
|
作者：
Dudek, H.J. [1 ]
机构：
[1] DFVLR, Institut für Werkstoff-Forschung, Linder Höhe, D-5000 Köln 90, Germany
来源：
TM. Technisches Messen | 1987年 / 54卷 / 09期
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摘要：
9
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页码：330 / 336
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