Microanalysis and Depth Profile Analysis by Auger Electron Spectroscopy.

被引：0

作者：

Dudek, H.J. ^{[1
]}

机构：

[1] DFVLR, Institut für Werkstoff-Forschung, Linder Höhe, D-5000 Köln 90, Germany

来源：

TM. Technisches Messen | 1987年 / 54卷 / 09期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：330 / 336

共 50 条

[31] EFFECT OF ELECTRON EJECTION DEPTH ON QUANTITATIVE-ANALYSIS BY AUGER-SPECTROSCOPY
MITYAGIN, AY
PANTELEEV, VV
CHEREVATSKII, NY
RADIOTEKHNIKA I ELEKTRONIKA, 1976, 21 (03): : 589 - 593
[32] DETERMINATION OF THE GRAIN BOUNDARY COMPOSITION OF SOFT FERRITES BY AUGER ELECTRON SPECTROSCOPY.
Franken, Peter E.C.
van Doveren, Harry
1978, 55 (06): : 287 - 289
[33] Nondestructive depth profiling in Auger electron spectroscopy by means of partial intensity analysis
Werner, WSM
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1997, 15 (03): : 465 - 469
[34] COMPOSITIONAL DEPTH PROFILING BY AUGER-ELECTRON SPECTROSCOPY
HALL, PM
MORABITO, JM
CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1978, 8 (01): : 53 - 67
[35] Study of Titanium Diboride Thin Films by Means of Auger Electron Spectroscopy.
Osipov, K.A.
Lazarev, E.M.
Borovich, T.L.
Korotkov, N.A.
Yusipov, N.Yu.
Neorganiceskie materialy, 1981, 17 (04): : 631 - 634
[36] PROBING DEPTH IN PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY
LINDAU, I
SPICER, WE
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (05) : 409 - 413
[37] QUANTITATIVE ANALYSIS OF Al2O3 THIN FILMS BY AUGER ELECTRON SPECTROSCOPY.
Cocito, M.
Meliga, M.
Palumbo, S.
Tamagno, S.
CSELT Technical Reports, 1986, 14 (06): : 473 - 474
[38] Depth profile analysis of hydrogen and helium isotopes by electron spectroscopy
Afanas'ev, V.P.
Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, 2005, (03): : 19 - 23
[39] APPLICATION OF AUGER ELECTRON DEPTH PROFILE ANALYSIS TO THIN FILM INTERDIFFUSION STUDIES.
Pamler, W.
Applied Physics A: Solids and Surfaces, 1987, A42 (03): : 219 - 226
[40] THE DEPTH DEPENDENCE OF THE DEPTH RESOLUTION IN COMPOSITION DEPTH PROFILING WITH AUGER-ELECTRON SPECTROSCOPY
SEAH, MP
HUNT, CP
SURFACE AND INTERFACE ANALYSIS, 1983, 5 (01) : 33 - 37

← 1 2 3 4 5 →