共 50 条
- [25] Utilization to HALT of boundary-Scan 1600, Japan Institute of Electronics Packaging (23): : 588 - 592
- [26] BOUNDARY-SCAN PLUS IN-CIRCUIT TEST TO ACHIEVE MAXIMUM FAULT COVERAGE ELECTRONIC ENGINEERING, 1993, 65 (804): : 37 - 38
- [27] A BIST and boundary-scan economics framework IEEE DESIGN & TEST OF COMPUTERS, 1997, 14 (03): : 17 - 23
- [28] LabVIEW Implemented Boundary-Scan Tester 2011 34TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE 2011) - NEW TRENDS IN MICRO/NANOTECHNOLOGY, 2011, : 282 - 287
- [29] Manufacturing processes using boundary-scan Natl Electron Packag Prod Conf Proc Tech Program, FEB. (37-41):
- [30] Development of VXIbus boundary-scan module ICEMI'2003: PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOLS 1-3, 2003, : 1710 - 1713