Algorithms of inserting boundary-scan circuit automatically

被引：0

作者：

Zhu, GuoHun ^{[1
]}

Yan, XueLong ^{[1
]}

Zhou, Ya ^{[1
]}

Guo, YueRen ^{[1
]}

机构：

[1] Guilin Inst of Electronic Technology, GuiLin, China

来源：

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：527 / 531

共 50 条

[41] The BSDL file for boundary-scan testing
Journal of Japan Institute of Electronics Packaging, 2020, 23 (01): : 112 - 115
[42] The basic functions of boundary-scan testing
Journal of Japan Institute of Electronics Packaging, 2019, 22 (07) : 617 - 621
[43] A roadmap for boundary-scan test reuse
Wedge, G
Conner, T
INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 340 - 346
[44] The success story of boundary-scan testing
バウンダリスキャン研究会
1600, Japan Institute of Electronics Packaging (23): : 287 - 291
[45] BOUNDARY-SCAN TESTING IN THE REAL WORLD
Stanbridge, James
ELECTRONICS WORLD, 2012, 118 (1920): : 26 - 28
[46] The latest trend of the boundary-scan standard
Journal of Japan Institute of Electronics Packaging, 2021, 24 (01): : 154 - 161
[47] USING BOUNDARY-SCAN AS THE BASIS OF BIST
不详
ELECTRONIC ENGINEERING, 1993, 65 (804): : 27 - 28
[48] TEXAS INSTRUMENTS BOUNDARY-SCAN TESTING
LEBAK, JM
LENHERT, DH
IEEE DESIGN & TEST OF COMPUTERS, 1991, 8 (01): : 96 - 97
[49] Backplane interconnect test in a boundary-scan environment
Ke, MD
INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 717 - 724
[50] SUCCESS WITH BOUNDARY-SCAN - A CASE-STUDY
MILO, P
EE-EVALUATION ENGINEERING, 1995, 34 (02): : 72 - &