Transient capacitance in metal-oxide-semiconductor structures with stacked gate dielectrics

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[1] Goto, Masakazu
[2] Higuchi, Keiichi
[3] Toril, Kazuyoshi
[4] 1,Hasunuma, Ryu
[5] 1,Yamabe, Kikuo
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Goto, M. | 1600年 / Japan Society of Applied Physics卷 / 43期
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