共 50 条
- [32] Anomalous ring-shaped distribution of oxygen precipitates in a Czochralski-grown silicon crystal 1600, American Inst of Physics, Woodbury, NY, USA (78):
- [33] Oxygen precipitation behavior in 300 mm polished Czochralski silicon wafers HIGH PURITY SILICON V, 1998, 98 (13): : 125 - 134
- [35] Control of oxygen precipitates distribution in large-diameter silicon wafers after thermal annealing NEC RESEARCH & DEVELOPMENT, 1996, 37 (04): : 423 - 431
- [36] Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 36 (1-3): : 230 - 236
- [37] Uniform stress effect on nucleation of oxygen precipitates in Czochralski grown silicon EARLY STAGES OF OXYGEN PRECIPITATION IN SILICON, 1996, 17 : 485 - 492
- [38] Infrared characterization of oxygen precipitates in silicon wafers with different concentrations of interstitial oxygen MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 73 (1-3): : 145 - 148