VLSI SPURS SELF-TESTING.

被引：0

作者：

Lyman, Jerry

机构：

来源：

Electronics | 1980年 / 53卷 / 27期

关键词：

INTEGRATED CIRCUITS - Very Large Scale Integration;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

All involved in the semiconductor industry know that very large-scale integrated circuits raise correspondingly large-scle problems for automated IC testing. Methods of self testing based on two approaches are presented. Test systems can be built on circuit boards for go/no-go indication or on chips for added fault detection.

引用

下载

共 50 条

[31] Iddq testing for CMOS VLSI
Rajsuman, R
PROCEEDINGS OF THE IEEE, 2000, 88 (04) : 544 - 566
[32] Fuzzy logic and VLSI testing
Atre, MV
Kumar, DK
DEFENCE SCIENCE JOURNAL, 1995, 45 (04) : 325 - 332
[33] TESTING - A MAJOR CONCERN FOR VLSI
GRAF, MC
SOLID STATE TECHNOLOGY, 1984, 27 (01) : 101 - 108
[34] TRENDS IN VLSI TESTING.
Chalkley, Michael J.
Digest of Papers - Semiconductor Test Symposium, 1979, : 3 - 6
[35] TESTING OF A SPECIAL VLSI DESIGN
ELZIQ, YM
JOURNAL OF DIGITAL SYSTEMS, 1980, 4 (01): : 3 - 20
[36] Testing VLSI regular arrays
Univ Coll, Cork, Ireland
J Electron Test Theory Appl JETTA, 2 (153-177):
[37] VLSI TESTING ENVELOPS DESIGNERS
不详
ELECTRONIC DESIGN, 1986, 34 (12) : 3 - 3
[38] VLSI COMPLEXITY CHALLENGES TESTING
BURSKY, D
ELECTRONIC DESIGN, 1987, 35 (07) : 39 - 40
[39] Special issue - VLSI testing
Das, SR
VLSI DESIGN, 2001, 12 (04) : I - III
[40] VLSI testing - Special issue
Das, SR
VLSI DESIGN, 1996, 4 (03) : R1 - R4

← 1 2 3 4 5 →