VLSI SPURS SELF-TESTING.

被引：0
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作者：
Lyman, Jerry
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来源：
Electronics | 1980年 / 53卷 / 27期
关键词：
INTEGRATED CIRCUITS - Very Large Scale Integration;
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摘要：
All involved in the semiconductor industry know that very large-scale integrated circuits raise correspondingly large-scle problems for automated IC testing. Methods of self testing based on two approaches are presented. Test systems can be built on circuit boards for go/no-go indication or on chips for added fault detection.
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