Demagnifying ion projection - A promising alternative to optical and x-ray lithography

被引:0
|
作者
Fallmann, W. [1 ]
Bruckner, A. [1 ]
Cekan, E. [1 ]
Friza, W. [1 ]
Stangl, G. [1 ]
Thalinger, F. [1 ]
Hudek, P. [1 ]
Loschner, H. [1 ]
Stengl, G. [1 ]
机构
[1] Technical Univ of Vienna, Vienna
来源
Electron Technology (Warsaw) | 1993年 / 26卷 / 01期
关键词
Ion beam lithography - Ions - Lithography - Masks - Microelectronics - Microprocessor chips - Optics - Semiconducting gallium arsenide - Vacuum applications - X ray lithography;
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学科分类号
摘要
Ion projection lithography shows the advantage of demagnifying ion-optical mask to wafer pattern transfer with sub-0.25 μm resolution combined with large depth of focus. There is also the possibility of electronic alignment ('pattern lock') of the projected ion image on-line during chip exposure with nanometer precision. Potential application areas of ion projection lithography include high volume silicon and GaAs chip fabrication and - implementing exposure field stitching and electrostatic step exposure techniques - the manufacture of flat panel devices based on vacuum microelectronics as well as patterning of curved surfaces.
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页码:107 / 114
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