Demagnifying ion projection - A promising alternative to optical and x-ray lithography

被引:0
|
作者
Fallmann, W. [1 ]
Bruckner, A. [1 ]
Cekan, E. [1 ]
Friza, W. [1 ]
Stangl, G. [1 ]
Thalinger, F. [1 ]
Hudek, P. [1 ]
Loschner, H. [1 ]
Stengl, G. [1 ]
机构
[1] Technical Univ of Vienna, Vienna
来源
Electron Technology (Warsaw) | 1993年 / 26卷 / 01期
关键词
Ion beam lithography - Ions - Lithography - Masks - Microelectronics - Microprocessor chips - Optics - Semiconducting gallium arsenide - Vacuum applications - X ray lithography;
D O I
暂无
中图分类号
学科分类号
摘要
Ion projection lithography shows the advantage of demagnifying ion-optical mask to wafer pattern transfer with sub-0.25 μm resolution combined with large depth of focus. There is also the possibility of electronic alignment ('pattern lock') of the projected ion image on-line during chip exposure with nanometer precision. Potential application areas of ion projection lithography include high volume silicon and GaAs chip fabrication and - implementing exposure field stitching and electrostatic step exposure techniques - the manufacture of flat panel devices based on vacuum microelectronics as well as patterning of curved surfaces.
引用
收藏
页码:107 / 114
相关论文
共 50 条
  • [21] Electroplated reflection masks for soft x-ray projection lithography
    Murakami, Katsuhiko
    Shimizu, Sumito
    Ohtani, Masayuki
    Nagata, Hiroshi
    Oizumi, Hiroaki
    Yamashita, Yoshio
    Atoda, Nobufumi
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1995, 34 (12 B): : 6696 - 6700
  • [22] Optical configurations for X-ray imaging by projection
    Alianelli, L
    del Rio, MS
    Faenov, AY
    Pikuz, T
    Felici, R
    Hignette, O
    JOURNAL DE PHYSIQUE IV, 2003, 104 : 267 - 270
  • [23] Wafer cost analysis for a soft X-ray projection lithography system
    Ceglio, N.M.
    Hawryluk, A.M.
    Journal of X-Ray Science and Technology, 1992, 3 (03)
  • [24] X-RAY LITHOGRAPHY
    SULLIVAN, PA
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 276 - 276
  • [25] X-RAY GRATINGS AND PROJECTION LITHOGRAPHY BY MEANS OF LATERALLY STRUCTURED MULTILAYERS
    HEINZMANN, U
    JOURNAL DE PHYSIQUE III, 1994, 4 (09): : 1625 - 1637
  • [26] X-RAY LITHOGRAPHY
    FEDER, R
    SPILLER, E
    TOPALIAN, J
    POLYMER ENGINEERING AND SCIENCE, 1977, 17 (06): : 385 - 389
  • [27] X-RAY LITHOGRAPHY
    SMITH, HI
    FLANDERS, DC
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 : 61 - 65
  • [28] An alternative optical design for X-ray telescopes
    Zocchi, Fabio E.
    Vernani, Dervis
    OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY III, 2007, 6688
  • [29] Reflective x-ray masks for x-ray lithography
    Chumak, V. S.
    Peredkov, S.
    Devizenko, A. Yu
    Kopylets, I. A.
    Pershyn, Yu P.
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2024, 34 (04)
  • [30] Ion beam lithography for coherent X-ray optics application
    Medvedskaya, P.
    Lyatun, I
    Shevyrtalov, S.
    Polikarpov, M.
    Snigireva, I
    Yunkin, V
    Snigirev, A.
    ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XV, 2020, 11491