DETERMINATION OF LATTICE DISTORTION IN (GaAs)28(AlAs)24 SUPERLATTICE LAYERS BY X-RAY DIFFRACTION.

被引：0

作者：

Kashihara, Yasuharu ^{[1
]}

Kase, Tomohiro ^{[1
]}

Harada, Jimpei ^{[1
]}

机构：

[1] Nagoya Univ, Nagoya, Jpn, Nagoya Univ, Nagoya, Jpn

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1986年 / 25卷 / 12期

关键词：

MOLECULAR BEAM EPITAXY - X-RAYS - Diffraction;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The structure of a (GaAs)//2//8(AlAs)//2//4 superlattice grown by MBE has been characterized in detail by X-ray diffraction. By applying a new method of Fourier analysis, both the concentration and lattice distortion modulations existing in the multilayer were determined on the basis of the integrated intensities of the satellite reflections around the (400) fundamental Bragg reflection. Both modulations were found to be like a step function. It is pointed out that the width of the boundary between the two regions should be narrow and less than two intermolecular layers. The spacings between successive cation layers were 2. 827 and 2. 835 A in the regions of GaAs and AlAl, respectively, along the (001) direction. This is in good agreement with the values calculated from the Poisson expansion model.

引用

页码：1834 / 1841

共 50 条

[31] Pushing the Limits of Lab X-ray (Micro) Diffraction.
Kirk, Caroline
Cressey, Gordon
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2004, 60 : S51 - S51
[32] Micro/nano mineralogy by synchrotron x-ray diffraction.
Mao, H
Shu, J
Hu, J
Finger, LW
Hemley, RJ
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1997, 214 : 27 - GEOC
[33] Characterisation of insulin microcrystals with x-ray powder diffraction.
Norrman, Mathias
Schluckebier, Gerd
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2004, 60 : S229 - S229
[34] Analysis of two species of cotton by X-ray diffraction.
Thibodeaux, DP
French, AD
Stevens, ED
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U276 - U276
[35] APPARATUS FOR STUDY OF EXTRINSIC PHOTOEFFECT WITH X-RAY DIFFRACTION.
Aleksandrov, P.A.
Bresler, E.E.
Bugrov, D.A.
Zashkvara, V.V.
Imamov, R.M.
Pashaev, E.M.
Red'kin, V.S.
Instruments and experimental techniques New York, 1986, 29 (1 pt 2): : 229 - 233
[36] MICROCOMPUTER CONTROL AND ANALYSIS TECHNIQUES FOR X-RAY DIFFRACTION.
Fewster, P.F.
Annual Review - Philips Research Laboratories, 1983, : 26 - 28
[37] DEPTH SELECTIVE ANALYSIS OF BURIED SEMICONDUCTOR LAYERS USING X-RAY GRAZING INCIDENCE DIFFRACTION.
Pietsch, U.
Rose, D.
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C472 - C472
[38] Determination of Complete Area Pole Figures of Sheet Metal Textures by X-Ray Diffraction.
Mayr, Michael
Materialpruefung/Materials Testing, 1976, 18 (04): : 123 - 126
[39] Effect of the gradient of deformation between superlattice layers on dynamic effects of x-ray diffraction
Dyshekov, AA
Tarasov, DA
Khapachev, YP
PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1995, 21 (13): : 6 - 10
[40] Determination of the superlattice structure factor by X-ray diffraction using a temperature gradient
Levonyan, Levon
Manukyan, Hasmik
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2023, 79 : 14 - 19

← 1 2 3 4 5 →