DETERMINATION OF LATTICE DISTORTION IN (GaAs)28(AlAs)24 SUPERLATTICE LAYERS BY X-RAY DIFFRACTION.

被引：0

作者：

Kashihara, Yasuharu ^{[1
]}

Kase, Tomohiro ^{[1
]}

Harada, Jimpei ^{[1
]}

机构：

[1] Nagoya Univ, Nagoya, Jpn, Nagoya Univ, Nagoya, Jpn

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes | 1986年 / 25卷 / 12期

关键词：

MOLECULAR BEAM EPITAXY - X-RAYS - Diffraction;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

The structure of a (GaAs)//2//8(AlAs)//2//4 superlattice grown by MBE has been characterized in detail by X-ray diffraction. By applying a new method of Fourier analysis, both the concentration and lattice distortion modulations existing in the multilayer were determined on the basis of the integrated intensities of the satellite reflections around the (400) fundamental Bragg reflection. Both modulations were found to be like a step function. It is pointed out that the width of the boundary between the two regions should be narrow and less than two intermolecular layers. The spacings between successive cation layers were 2. 827 and 2. 835 A in the regions of GaAs and AlAl, respectively, along the (001) direction. This is in good agreement with the values calculated from the Poisson expansion model.

引用

页码：1834 / 1841

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