Characterisation of InGaAs/GaAs superlattice structures by X-ray double crystal diffraction

被引：0
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作者：
Shrivastava, M.C. [1 ]
Swaminathan, S. [1 ]
机构：
[1] Univ of Roorkee, India
来源：
Microelectronics Journal | 1988年 / 19卷 / 05期
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摘要：
16
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页码：29 / 33
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