Convergence scheme for over-erased flash EEPROM's using substrate-bias-enhanced hot electron injection

被引：0
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作者：
Hu, C.-Y. [1 ]
Kencke, D.L. [1 ]
Banerjee, S.K. [1 ]
Richart, R. [1 ]
Bandyopadhyay, B. [1 ]
Moore, B. [1 ]
Ibok, E. [1 ]
Garg, S. [1 ]
机构：
[1] Univ of Texas, Austin, United States
来源：
| 1600年 / IEEE, Piscataway, NJ, United States卷 / 16期
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PROM;
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