SPECIAL TECHNIQUES FOR THE AUGER ANALYSIS OF MICROELECTRONIC DEVICES.

被引:0
|
作者
Leung, M.S. [1 ]
Stupian, G.W. [1 ]
机构
[1] Aerospace Corp, El Segundo, CA, USA, Aerospace Corp, El Segundo, CA, USA
关键词
AUGER ANALYSIS - DEPTH PROFILING - MICROELECTRONIC DEVICES;
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摘要
(Edited Abstract)
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页码:435 / 445
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