ANALYSIS STRATEGY FOR INTERNAL MEASUREMENTS ON VLSI DEVICES.

被引：3

作者：

Kolzer, Jochen ^{[1
]}

Frieling, Focko ^{[1
]}

Cutter, David ^{[1
]}

机构：

[1] Corporate Research & Technology, Munich, West Ger, Corporate Research & Technology, Munich, West Ger

来源：

Microelectronic Engineering | 1987年 / 6卷 / 1-4期

关键词：

D O I：

10.1016/0167-9317(87)90014-1

中图分类号：

学科分类号：

摘要：

INTEGRATED CIRCUITS

引用

页码：23 / 28

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