ANALYSIS STRATEGY FOR INTERNAL MEASUREMENTS ON VLSI DEVICES.

被引：3
|
作者：
Kolzer, Jochen [1 ]
Frieling, Focko [1 ]
Cutter, David [1 ]
机构：
[1] Corporate Research & Technology, Munich, West Ger, Corporate Research & Technology, Munich, West Ger
来源：
Microelectronic Engineering | 1987年 / 6卷 / 1-4期
关键词：
D O I：
10.1016/0167-9317(87)90014-1
中图分类号：
学科分类号：
摘要：
INTEGRATED CIRCUITS
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收藏
页码：23 / 28
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