MODELING AND TEST GENERATION ALGORITHMS FOR MOS CIRCUITS.

被引：20
|
作者：
Jain, Sunil K. [1 ]
Agrawal, Vishwani D. [1 ]
机构：
[1] AT&T Bell Lab, Murray Hill, NJ,, USA, AT&T Bell Lab, Murray Hill, NJ, USA
来源：
IEEE Transactions on Computers | 1985年 / C-34卷 / 05期
关键词：
D-ALGORITHM - MOS CIRCUIT FAULTS - STUCK FAULTS - TEST GENERATION ALGORITHMS;
D O I：
10.1109/TC.1985.1676582
中图分类号：
学科分类号：
摘要：
引用
下载
收藏
页码：426 / 433
相关论文
共 50 条
  • [41] Analysis of Optimization Algorithms in Automated Test Pattern Generation for Sequential Circuits
    Alateeq, Majed M.
    Pedrycz, Witold
    2017 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN, AND CYBERNETICS (SMC), 2017, : 1834 - 1839
  • [42] Automatic test pattern generation for sequential circuits using genetic algorithms
    Rajesh, V
    Jain, A
    ELEVENTH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS, 1997, : 270 - 273
  • [43] SOFTWARE MODELING OF LOGIC CIRCUITS WITH RESPECT TO TEST GENERATION.
    Mikolajczak, Boleslaw
    Modelling, Measurement and Control A, 1984, 1 (04): : 27 - 31
  • [44] Telephone circuits.
    Perry, J
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1910, 22 : 0252 - 0272
  • [45] HYBRID CIRCUITS.
    Polden, John
    Engineering (London), 1980, 220 (03):
  • [46] RECEIVER CIRCUITS.
    Crispi, F.J.
    Ritchie, L.C.
    Swietek, D.J.
    IBM technical disclosure bulletin, 1983, 25 (09): : 4832 - 4833
  • [47] INFLUENCE OF TEMPERATURE ON THE POTENTIAL AND FIELD DISTRIBUTIONS IN MICRORESISTORS AND HALLTRONS FOR MOS INTEGRATED CIRCUITS.
    Velchev, N.B.
    Petrov, I.R.
    Electron Technology (Warsaw), 1984, 15 (3-4): : 35 - 47
  • [48] SQUARE-ROOTING ALGORITHMS FOR HIGH-SPEED DIGITAL CIRCUITS.
    Majerski, Stanislaw
    IEEE Transactions on Computers, 1985, C-34 (08) : 724 - 733
  • [49] Class of Computer Algorithms for the Computer-Aided Analysis of Nonlinear Circuits.
    Kolyada, Yu.V.
    Sigorskii, V.P.
    Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika, 1975, 18 (05): : 73 - 78
  • [50] BELL-RINGER IC UNITES C-MOS, BIPOLAR CIRCUITS.
    Riess, Michael H.
    Electronics, 1982, 55 (14): : 147 - 150
12345