CHECKING CLOSE TOLERANCES ON THICK-FILM SUBSTRATES.

An automated visual inspection system has been developed by Applied Intelligent Systems, Ann Arbor, MI. It checks thick-film patterns for flaws such as smears, voids on missing material, oversized patterns or extra material, as well as misplaced or rotated patterns. By inspecting the components immediately after the pattern has been laid down and before the substrate is fired, faulty parts can be cleaned and reclaimed. This method eliminates further processing of bad parts and saves the costs associated with these processes. An obvious advantage to automated inspection of thick-film patterns is that it permits continuous and 100 percent inspection of circuits, rather than spot checks. This prevents defective products from reaching customers. Other advantages of the automated inspection system include: consistency, precision, and real-time process control.