Use of Noise Characteristics of Thin-Film Resistors While Optimizing the Technological Process.

被引：0
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作者：
Ostrova, S.O.
Asadullina, V.R.
Tkacheva, I.N.
Belyakin, A.M.
机构：
来源：
Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika | 1974年 / 17卷 / 12期
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摘要：
RESISTORS
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页码：80 / 82
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