Use of Noise Characteristics of Thin-Film Resistors While Optimizing the Technological Process.

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作者：

Ostrova, S.O.

Asadullina, V.R.

Tkacheva, I.N.

Belyakin, A.M.

机构：

来源：

Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika | 1974年 / 17卷 / 12期

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Compendex;

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摘要：

RESISTORS

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页码：80 / 82

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