共 50 条
- [42] The evaluation of copper migration during the die attach curing and second wire bonding process IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2005, 28 (02): : 337 - 344
- [43] 2N Wire for Ultra Fine Pitch Wire Bonding: Challenges & Solutions EPTC: 2008 10TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS 1-3, 2008, : 795 - +
- [44] Challenges of Fine Pitch Copper Wire Bonding in BGA packages IEMT 2006: 31ST INTERNATIONAL CONFERENCE ON ELECTRONICS MANUFACTURING AND TECHNOLOGY, 2006, : 347 - +
- [45] Cu wire Development for Thin QFN Package using Die Attach Film (DAF) 2013 8TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT), 2013, : 302 - 305
- [47] SOLDER WIRE DIE BOND PROCESS CHARACTERIZATION STUDY JOURNAL OF ELECTRONICS MANUFACTURING, 1995, 5 (01): : 49 - 55
- [49] Welche Anforderungen stellt die 'Fine-Pitch'-Bestueckung? F & M; Feinwerktechnik & Messtechnik, 1992, 100 (11):
- [50] Impact of Ag Plated Surface Roughness towards Die Bond and Wire Bond PROCEEDINGS OF THE 2013 IEEE 15TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC 2013), 2013, : 882 - 886