Challenges of Fine Pitch Copper Wire Bonding in BGA packages

被引:0
|
作者
Ibrahim, Mohd Rusli [1 ]
Choi, Yong Cheng [1 ]
Lim, Larry [2 ]
Lu, Jiang [2 ]
Poh, Low Teck [3 ]
Ai, Poh Chiew [3 ]
机构
[1] Freescale Semicond Malaysia Sdn Bhd, 2 Jalan SS 8-2,FIZ Sungei Way, Petaling Jaya 47000, Selangor, Malaysia
[2] ASM Technol Singapore Pte Ltd, Singapore 768924, Singapore
[3] MEM Sdn Bhd, Shah Alam 40200, Malaysia
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D O I
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Copper wire technology is not new to the semiconductor industry especially for midrange I/O packages such as SOIC and PDIP, which require thicker wire diameter. Today, copper wire bonding has seen increasing demand for higher quality and lower cost packaging. In recent years, a few companies have started development work in high pin count packages especially for BGA packages, which require smaller wire diameter (1mil and below). Freescale is one company that has been aggressively pursuing further developments. Development and optimisation of robust fine pitch copper wire bonding processes for BGA packages requires an assessment of Cu-Al inter-metallic growth after isothermal ageing. This paper specifically discusses the material requirements, capillary selection, and some characteristics of the Cu-Al system, as well as a comparison to Au-Al system, The challenges of copper wire bonding in different bond pad thickness and metallization are also briefly discussed.
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页码:347 / +
页数:2
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