共 50 条
- [1] RAMAN-SCATTERING CHARACTERIZATION OF STRAIN IN GAAS HETEROEPITAXIAL FILMS GROWN ON SAPPHIRE AND SILICON-ON-SAPPHIRE SUBSTRATES JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (09): : L1595 - L1598
- [3] A COMBINED TEM XRD STUDY OF MOCVD GAAS FILMS GROWN ON SILICON, SAPPHIRE AND SILICON-ON-SAPPHIRE MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 121 - 126
- [4] A COMBINED TEM XRD STUDY OF MOCVD GAAS FILMS GROWN ON SILICON, SAPPHIRE AND SILICON-ON-SAPPHIRE INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (100): : 121 - 126
- [7] MOLECULAR-BEAM EPITAXIAL-GROWTH AND CHARACTERIZATION OF GAAS ON SAPPHIRE AND SILICON-ON-SAPPHIRE SUBSTRATES ADVANCES IN MATERIALS, PROCESSING AND DEVICES IN III-V COMPOUND SEMICONDUCTORS, 1989, 144 : 195 - 200
- [9] RAMAN-SCATTERING CHARACTERIZATION OF RESIDUAL-STRESSES IN SILICON-ON-SAPPHIRE JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1984, 23 (06): : 681 - 686