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- [1] Raman scattering characterization of strain in GaAs heteroepitaxial films grown on sapphire and silicon-on-sapphire substrates Humphreys, T.P., 1600, (28):
- [2] RAMAN-SCATTERING CHARACTERIZATION OF STRAIN IN GAAS HETEROEPITAXIAL FILMS GROWN ON SAPPHIRE AND SILICON-ON-SAPPHIRE SUBSTRATES JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (09): : L1595 - L1598
- [5] A COMBINED TEM XRD STUDY OF MOCVD GAAS FILMS GROWN ON SILICON, SAPPHIRE AND SILICON-ON-SAPPHIRE MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 121 - 126
- [6] A COMBINED TEM XRD STUDY OF MOCVD GAAS FILMS GROWN ON SILICON, SAPPHIRE AND SILICON-ON-SAPPHIRE INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (100): : 121 - 126
- [8] Process Optimization of Silicon-on-Sapphire Vapor-Phase Epitaxy PROCEEDINGS OF THE 2018 IEEE CONFERENCE OF RUSSIAN YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING (EICONRUS), 2018, : 1613 - 1617
- [10] COMPARISON OF PROPERTIES OF SOLID-PHASE EPITAXIAL SILICON-ON-SAPPHIRE FILMS RECRYSTALLIZED BY RAPID THERMAL ANNEALING AND FURNACE ANNEALING MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1995, 29 (1-3): : 43 - 46