HARDWARE DESCRIPTION LEVELS AND TEST FOR COMPLEX CIRCUITS.

被引：0
|
作者：
Bellon, C.
Saucier, G.
Gobbi, J.M.
机构：
来源：
Proceedings - Design Automation Conference | 1981年
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：213 / 219
相关论文
共 50 条
  • [1] HARDWARE DESCRIPTION LANGUAGE SCULPTS COMPLEX CIRCUITS
    BAKALAR, K
    ELECTRONIC DESIGN, 1987, 35 (18) : 119 - &
  • [2] HARDWARE IMPLEMENTATION OF FUZZY LOGIC CIRCUITS.
    Pratapa Reddy, V.C.V.
    Zeitschrift fur Elektrische Informations - und Energietechnik, 1979, 9 (01): : 85 - 90
  • [3] TEST LANGUAGE FOR HYBRID CIRCUITS.
    Bailey, Bill
    New Electronics, 1980, 13 (23): : 49 - 50
  • [4] PALs SIMPLIFY COMPLEX CIRCUITS.
    Marshall, Trevor G.
    Byte, 1987, 12 (0l): : 247 - 259
  • [5] TEST GENERATION SYSTEM FOR DIGITAL CIRCUITS.
    Tomita, Kyouji
    Funatsu, Shigehiro
    Wakatsuki, Nobuo
    Yamada, Akihiko
    NEC Research and Development, 1978, (49): : 16 - 24
  • [6] IMPROVED SIGNATURE TEST FOR VLSI CIRCUITS.
    Carter, J.L.
    IBM technical disclosure bulletin, 1983, 26 (3 A): : 965 - 967
  • [7] TEST PLANT CLEANS WITH FIVE CIRCUITS.
    Green, Peter
    Coal age, 1981, 86 (07): : 122 - 124
  • [8] PHASE MODULATION AND COMPLEX SQUID CIRCUITS.
    Belonogov, S.A.
    Snigirev, O.V.
    Tinchev, S.S.
    Likharev, K.K.
    Radio Engineering and Electronic Physics (English translation of Radiotekhnika i Elektronika), 1980, 25 (12): : 116 - 122
  • [9] MODELING AND TEST GENERATION ALGORITHMS FOR MOS CIRCUITS.
    Jain, Sunil K.
    Agrawal, Vishwani D.
    IEEE Transactions on Computers, 1985, C-34 (05) : 426 - 433
  • [10] TEST-GENERATION FOR CIRCUITS DESCRIBED IN PROCEDURAL HARDWARE DESCRIPTION LANGUAGES (HDLS)
    SAPIECHA, K
    CZICHON, T
    MICROPROCESSING AND MICROPROGRAMMING, 1986, 18 (1-5): : 371 - 379
12345