共 50 条
- [21] METHOD OF OBTAINING DATA FOR HARDWARE TESTING AND ERROR DIAGNOSIS IN SEQUENTIAL LOGIC CIRCUITS. IBM technical disclosure bulletin, 1985, 27 (08):
- [22] EBT: A COMPREHENSIVE TEST GENERATION TECHNIQUE FOR HIGHLY SEQUENTUAL CIRCUITS. 1978, : 335 - 339
- [26] On the resonance of paired circuits. COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES, 1925, 180 : 1725 - 1728
- [28] IMPROVEMENTS IN CENTERING CIRCUITS. IBM technical disclosure bulletin, 1984, 26 (08): : 4069 - 4071
- [29] Description of a Laboratory Plasma Reactor. Application to Failure Analysis of Integrated Circuits. Vide, les Couches Minces, 1985, (229):