NIST workshop on thin dielectric film metrology

被引:0
|
作者
Belzer, Barbara J.
Ehrstein, James R.
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] NIST metrology tool locates molecular features
    不详
    SOLID STATE TECHNOLOGY, 1996, 39 (02) : 38 - 38
  • [32] Projection display metrology at NIST: Measurements and diagnostics
    Boynton, PA
    Kelley, EF
    Libert, JM
    LIQUID CRYSTAL MATERIALS, DEVICES, AND APPLICATIONS X AND PROJECTION DISPLAYS X, 2004, 5289 : 302 - 313
  • [33] 100 years of optical science and metrology at NIST
    Ott, WR
    HARNESSING LIGHT: OPTICAL SCIENCE AND METROLOGY AT NIST, 2001, 4450 : 1 - 14
  • [34] NIST efforts in extreme-ultraviolet metrology
    Tarrio, C.
    Grantham, S.
    Vest, R. E.
    Germer, T. A.
    Barnes, B. M.
    Moffitt, S. L.
    Simonds, B. J.
    Spidell, M.
    INTERNATIONAL CONFERENCE ON EXTREME ULTRAVIOLET LITHOGRAPHY 2023, 2023, 12750
  • [35] Scanning probe microscope dimensional metrology at NIST
    Kramar, John A.
    Dixson, Ronald
    Orji, Ndubuisi G.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2011, 22 (02)
  • [36] NIST WORK CONFIRMS THE BENEFITS OF THIN-FILM THERMAL CONVERTERS
    NOVELLINO, J
    ELECTRONIC DESIGN, 1993, 41 (13) : 40 - 41
  • [37] Overview of NIST metrology development for the semiconductor industry
    Knight, S
    11TH IEEE INTERNATIONAL CONFERENCE ON ADVANCED THERMAL PROCESSING OF SEMICONDUCTORS, 2003, : 35 - 44
  • [38] DIELECTRIC BREAKDOWN OF THIN ALUMINA FILM
    KAWAMURA, H
    AZUMA, K
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1953, 8 (06) : 797 - 798
  • [39] SILICON NITRIDE THIN FILM DIELECTRIC
    BARNES, CR
    GEESNER, CR
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1960, 107 (02) : 98 - 100
  • [40] UME – NIST Workshop on Establishment of Chemical and Medical Metrology Laboratories at UME, Gebze, Turkey, 19–20 June 2000
    I. Kuselman
    Accreditation and Quality Assurance, 2000, 5 (10-11) : 453 - 454