Automated design for testability (DFT) tools for VLSI circuits

被引：0
|
作者：
Bhawmik, Sudipta [1 ]
Das, Aloke K. [1 ]
Palchaudhuri, Parimal [1 ]
机构：
[1] Indian Inst of Technology, India
来源：
IETE Journal of Research | 1988年 / 34卷 / 03期
关键词：
D O I：
10.1080/03772063.1988.11436738
中图分类号：
学科分类号：
摘要：
20
引用
收藏
页码：268 / 277
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